A new mixed hardening methodology applied to a 28 nm FDSOI 32-bits DSP subjected to gamma radiation

This work presents the performance degradation of a 32-bit DSP fabricated with 28 nm FDSOI technology subjected to different levels gamma radiation. A new mixed hardening methodology based on electrical compensation and thermal regeneration is applied irradiated devices recover degraded characteristics induced by total ionizing dose. The application this seeks extend lifetime integrated circuits under high radiation conditions while keeping good reliability.